TT | Device name |
Uses |
1. | Sputtering ATC-200UHV sputtering device
|
Six electronic guns, a main vacuum chamber, and a vacuum chamber allow for the rapid fabrication of thin films up to several hundred nanometers. It is possible to make films with fast and accurate multi-layer structure. |
2. | Sputtering BOC – Edwards 500 sputtering equipment | Three electronic guns, a vacuum chamber that allows the fabrication of high-deposition films with a membrane thickness of several nanometers to a few mm. |
3. | PLD (Pulse Laser Deposition) Pioneer 120 PLD | Allows the production of thin films up to 0.1 nm in thickness, the chemical composition of which corresponds to the material of the material. |
4. | Pulsed electron deposition Model: PEBS-20 Brand: Neocera | Allows the production of thin films up to 0.1 nm in thickness, the chemical composition of which corresponds to the material of the material. |
5. | X-ray diffraction (Brucker D8 Advance) | Examine the crystal structure of the material, determine the type of network, the size of the material. |
6. | AFM and MFM atomic force microscopes | Check the surface roughness of the material, analyze the surface structure of the material, analyze the electrical and magnetic energy of the material. |
7. | Scanning electron microscope | Morphological examination of the surface of the material, the thickness of the material. Oriented crystal analysis. |
8. | Dry etching system Model: NRE-4000 Manufacturer: Nano-Master Inc | Shaping the structure for the soleplate to make the desired assembly. |
9. | Laser Machining (Laser machining) Model: M-360 Manufacturer: Laser Universal System | Cutting, engraving, shaping structures for soles, materials. |
10. | Surface profiler Model: D150 Brand: Veeco | Check the roughness, thickness of the material. |
11. | Ferroelectric Test System Precision LC (10V); Radiant Technologies, Inc. – USA | Analysis of electrical properties, electrical polarization, dielectric properties of materials. |
12. | Keithley Model 4200-SCS / F Semiconductor Characterization System | Analyze, check the electrical properties of materials, semiconductor components. |
13. | Resistance measurement of wafer by 4-way resistor (Resistivity system) | Measure the square resistance of the membrane. |
14. | Optical microscope with CCD camera | Observation of materials, components. |
15. | Laurell WS-400B rotary press | Fabrication of thin films. |
16. | Mask MTB4-Suss Mask | Create structure for materials, components. |
17. | FD33 Fine placer | Welding, joining blocks of materials. |
18. | VKAM cutter | Cutting materials, Si soles. |
19. | 626 Hybond wire welding machine | Soldering parts, creating micro-contact. |
20. | Lakehore 7404 vibration sampler | Measure the magnetic properties of the material. |
21. | Small Signal Amplifier, Low Noise Model: SR560 and Model: SR570 | Signal amplification, noise reduction |
22. | Kistler 5011B power amplifier | Charge amplifier |
23. | Measurement and power sources PA Keithley 236 | Creates lines up to 0.1 nA accuracy |
24. | Magnets and power source GMW 5403 | Create external magnetic fields |
25. | Magnetic measuring device | Magnetic field with accuracy up to 0.01 Oe |
26. | Oscilloscope Tektronix DP04032 | Measure the electrical signal |
27. | Lock-in Amplifier 7265 DSP | Signal amplification, noise reduction |
28. | Incubators and vacuum pumps | Create a high temperature environment |
29. | Measuring system from resistance | Measure the electromagnetic properties of the material |
30. | Measurement of RLC electrical properties | Measure the resistance, impedance, resistance of materials, components. |
Home Research Equipments